Ray, B. (2001, June), Electronic Circuit Design And Analysis For Space Applications  Paper presented at 2001 Annual Conference, Albuquerque, New Mexico. 10.18260/1-2--9172

\bibitem{asee_peer_9172}
  Ray, B. (2001, June), \emph{Electronic Circuit Design And Analysis For Space Applications}
  Paper presented at 2001 Annual Conference, Albuquerque, New Mexico.
  10.18260/1-2--9172

Biswajit Ray.  "Electronic Circuit Design And Analysis For Space Applications".  2001 Annual Conference, Albuquerque, New Mexico, 2001, June.  ASEE Conferences, 2001.  https://strategy.asee.org/9172 Internet.  28 May, 2024

\bibitem{asee_peer_9172}
  Biswajit Ray.
  "Electronic Circuit Design And Analysis For Space Applications".
  \emph{2001 Annual Conference, Albuquerque, New Mexico, 2001, June}.
  ASEE Conferences, 2001.
  https://strategy.asee.org/9172 Internet.  28 May, 2024

@INPROCEEDINGS{asee_peer_9172
author = "Biswajit Ray"
title = "Electronic Circuit Design And Analysis For Space Applications"
booktitle = "2001 Annual Conference"
year = "2001"
month = "June"
address = "Albuquerque, New Mexico"
publisher = "ASEE Conferences"
note = {https://strategy.asee.org/9172}
number = {10.18260/1-2--9172}
}

TY  - CPAPER
AB  - Electronic circuit design and analysis in commercial applications takes into account component parameter variations due to initial tolerance, temperature, and aging. For space applications, the additional component parameter variation due to radiation needs to be taken into account. The charged particles in space radiation environment consist primarily of high-energy electrons, protons, alpha particles and heavy ions (cosmic rays). The radiation effects of these charged particles are dominated by ionization in electronic devices, and the resulting total ionizing dose (TID), single-event effects (SEE), and enhanced low dose rate sensitivity (ELDRS) issues are briefly discussed. Details of circuit design and worst case analysis are presented for two simple circuits: a three-terminal linear regulator, and a relay coil driver. Approaches to the detailed worst case circuit analysis, and an awareness on the need of the analysis to be performed before the design is released to manufacturing should be part of a well-rounded electronics design curriculum.
AU  - Biswajit Ray
CY  - Albuquerque, New Mexico
DA  - 2001/06/24
PB  - ASEE Conferences
TI  - Electronic Circuit Design And Analysis For Space Applications
UR  - https://strategy.asee.org/9172
DO  - 10.18260/1-2--9172
ER  -