Youssef Allam, Ohio State University; David Tomasko, Ohio State University; John Merrill, Ohio State University; Bruce Trott, Ohio State University; Phil Schlosser, Ohio State University; Paul Clingan, Ohio State University
Cajetan Akujuobi, Prairie View A&M University; Matthew Sadiku, Prairie View A&M University; Alam Shumon, Prairie View A&M University; Veeramuthu Rajaravivarma, Central Connecticut State University
Michael Loui, University of Illinois-Urbana Champaign; James Longino, University of Illinois-Urbana Champaign; Craig Zilles, University of Illinois-Urbana Champaign
Thomas Liu, University of Michigan; Christopher Deline, University of Michigan; Rafael Ramos, University of Michigan; Steven Sandoval, University of Michigan; Ashley Smetana, University of Michigan; Brian Gilchrist, University of Michigan; Peter Washabaugh, University of Michigan; Nilton Renno, University of Michigan
Roxanne Toto, Pennsylvania State University; Mark Wharton, Pennsylvania State University; John Cimbala, Pennsylvania State University; John Wise, Pennsylvania State University
John Phillips, University of Guelph; Michele Oliver, University of Guelph; Bill Van Heyst, University of Guelph; Douglas Joy, University of Guelph; Warren Stiver, University of Guelph
Donald Keating, University of South Carolina; Thomas Stanford, University of South Carolina; John Bardo, Western Carolina University; Duane Dunlap, Western Carolina University; Dennis Depew, Purdue University; Niaz Latif, Purdue University; Gary Bertoline, Purdue University; Stephen Tricamo, New Jersey Institute of Technology; Harvey Palmer, Rochester Institute of Technology; Albert McHenry, Arizona State University; Eugene DeLoatch, Morgan State University; Mohammad Noori, California State Polytechnic; Ronald Bennett, University of St. Thomas; Jay Snellenberger, Rolls-Royce; Samuel Truesdale, Rolls-Royce
Dennis Depew, Purdue University; Niaz Latif, Purdue University; Gary Bertoline, Purdue University; Donald Keating, University of South Carolina; Thomas Stanford, University of South Carolina; Stephen Tricamo, New Jersey Institute of Technology; Duane Dunlap, Western Carolina University; Albert McHenry, Arizona State University; Harvey Palmer, Rochester Institute of Technology; Eugene DeLoatch, Morgan State University; Ronald Bennett, University of St. Thomas; Mohammad Noori, California State Polytechnic University; Jay Snellenberger, Rolls-Royce; Samuel Truesdale, Rolls-Royce
Convergence of Quality Assurance Systems Around the Globe
Collection
2006 Annual Conference & Exposition
Authors
Kurt Paterson, Michigan Technological University; Linda Phillips, Michigan Technological University; David Watkins, Michigan Technological University; James Mihelcic, Michigan Technological University
Melissa Green, United Negro College Fund Special Programs Corp; Maria Jackson Hittle, UNCF SP; Gholam Ali Shaykhian, NASA; Robert Singleterry, NASA; Victor Obot, Texas Southern University; Premkumar Saganti, Prairie View A&M University; Marc Mendez, Texas A&M University-Corpus Christi; Jianping Yue, Essex County College; Jack Esparza, Texas A&M University-Corpus Christi; Rafic Bachnak, Texas A&M University-Corpus Christi; Kenneth Fernandez; Pamela Denkins