Mahmoud Alahmad, University of Nebraska-Lincoln; Matthew Pfannenstiel, University of Nebraska-Lincoln; Douglas Alvine, Alvine Engineering; Clarence Waters, University of Nebraska-Lincoln
Matthew Green, LeTourneau University; Paul Leiffer, LeTourneau University; Thomas Hellmuth, LeTourneau University; Roger Gonzalez, LeTourneau University; Stephen Ayers, LeTourneau University
Noel Schulz, Mississippi State University; Herbert Ginn, Mississippi State University; Stanislaw Grzybowski, Mississippi State University; Anurag Srivastava, Mississippi State University; Jimena Bastos, Mississippi State University
P. Ruby Mawasha, Wright State University; Kumar Yelamarthi, Wright State University; J. Mitch Wolff, Wright State University; Joseph Slater, Wright State University; Zhiqiang Wu, Wright State University
Wayne Walter, Rochester Institute of Technology; Jeffrey Webb, Rochester Institute of Technology; Mark Smith, Rochester Institute of Technology; Elizabeth DeBartolo, Rochester Institute of Technology; Margaret Bailey, Rochester Institute of Technology; George Slack, Rochester Institute of Technology
Richard Smith, Rensselaer Polytechnic Institute; Tracy N Schierenbeck, Rensselaer Polytechnic Institute; Linda McCloskey, Rensselaer Polytechnic Institute
William Waldron, Grand Valley State University; Pramod Chaphalkar, Grand Valley State University; Shabbir Choudhuri, Grand Valley State University; John Farris, Grand Valley State University
Frank Yeboah, North Carolina A&T State University; Harmohindar Singh, North Carolina A&T State University; Shamsuddin Ilias, North Carolina A&T State University
Sohail Anwar, Pennsylvania State University-Altoona College; Jungwoo Ryoo, Pennsylvania State University-Altoona College; Harpal Dhillon, Excelsior College; David Barnes, Pennsylvania State University-Altoona College