Lauren A. Rockenbaugh, University of Colorado, Boulder; Daria A. Kotys-Schwartz, University of Colorado, Boulder; Derek T. Reamon, University of Colorado, Boulder
Dale N. Buechler, University of Wisconsin, Platteville; Phil J. Sealy, University of Wisconsin, Platteville; John Goomey, University of Wisconsin, Platteville
Esteban Rodriguez-Marek, Eastern Washington University; Min-Sung Koh, Eastern Washington University; Claudio Talarico, Eastern Washington University; Jabulani Nyathi, Eastern Washington University
Kristi J. Shryock, Texas A&M University; Kaushik Das, Texas A&M University, College Station; Stephen Oehler, Texas A&M University; Jacques C. Richard, Texas A&M University; Dimitris C. Lagoudas, Texas A&M University
Jayaraman J.Thiagarajan, Arizona State University; Raja Ayyanar, Arizona State University; Andreas S. Spanias, Arizona State University, ECEE, SenSIP Center
Antonio Francisco Mondragon-Torres, Rochester Institute of Technology; Mahesh Nandan Kommi, Rochester Institute of Technology; Tamoghna Bhattacharya, Rochester Institute of Technology
Steve Hsiung, Old Dominion University; Walter F. Deal III, Old Dominion University; Lacides Agustin Osorio, Norfolk Ship Support Activity; Mathew Henderson, Tidewater Community College
TAC/ABET Related Outcome Based Assessment Methods and Models
Collection
2011 ASEE Annual Conference & Exposition
Authors
Mitchell L. Springer, Purdue University, West Lafayette; Mark T. Schuver, Purdue University, West Lafayette, College of Technology; Michael J. Dyrenfurth, Purdue University, West Lafayette
TAC/ABET Related Outcome Based Assessment Methods and Models
Collection
2011 ASEE Annual Conference & Exposition
Authors
Ilya Grinberg, Buffalo State College; Ronald E. Land, Pennsylvania State University, New Kensington; Thomas M. Hall Jr., Northwestern State University; Kelly Ann Lacroix, Society of Manufacturing Engineers; Steve Macho, Buffalo State College; Mike Eastman, Rochester Institute of Technology
TAC/ABET Related Outcome Based Assessment Methods and Models
Collection
2011 ASEE Annual Conference & Exposition
Authors
Richard Cliver, Rochester Institute of Technology (CAST); William M. Leonard, Rochester Institute of Technology; Elizabeth Dell, Rochester Institute of Technology; Robert A. Merrill, Rochester Institute of Technology