David B. Knight, Virginia Tech, Department of Engineering Education; Cory Brozina, Virginia Tech; Eric M. Stauffer, Virginia Tech; Chris Frisina, Virginia Tech; Troy D. Abel, Virginia Tech
Computer-Based Tests, Problems, and Other Instructional Materials
Collection
2015 ASEE Annual Conference & Exposition
Authors
Alex Daniel Edgcomb, University of California, Riverside; Joshua Sai Yuen, University of California, RIverside; Frank Vahid, University of California, Riverside
Yizhe Chang, Stevens Institute of Technology; El-Sayed S. Aziz, Stevens Institute of Technology; Zhou Zhang, Stevens Institute of Technology; Mingshao Zhang, Southern Illinois University, Edwardsville; Sven K. Esche, Stevens Institute of Technology (School of Engineering and Science)
Computer-Based Tests, Problems, and Other Instructional Materials
Collection
2015 ASEE Annual Conference & Exposition
Authors
Matthew West, University of Illinois, Urbana-Champaign; Geoffrey L. Herman, University of Illinois, Urbana-Champaign; Craig Zilles, University of Illinois, Urbana-Champaign
Matthew West, University of Illinois, Urbana-Champaign; Mariana Silva , University of Illinois at Urbana-Champaign; Geoffrey L. Herman, University of Illinois, Urbana-Champaign
Wade Fagen-Ulmschneider, University of Illinois, Urbana-Champaign; Cinda Heeren, University of Illinois, Urbana-Champaign; Geoffrey L. Herman, University of Illinois, Urbana-Champaign; Matthew West, University of Illinois, Urbana-Champaign
Zhou Zhang, Stevens Institute of Technology; Mingshao Zhang, Stevens Institute of Technology; Yizhe Chang, Stevens Institute of Technology, School of Engineering and Science; Sven K. Esche, Stevens Institute of Technology, School of Engineering and Science; Constantin Chassapis, Stevens Institute of Technology, School of Engineering and Science