Alex Daniel Edgcomb, University of California, Riverside; Frank Vahid, University of California, Riverside; Roman Lysecky, University of Arizona; Andre Knoesen, University of California, Davis; Rajeevan Amirtharajah, University of California, Davis; Mary Lou Dorf, University of Michigan, Ann Arbor
Oscar Antonio Perez, University of Texas, El Paso; Mike Thomas Pitcher, University of Texas, El Paso; Pedro Arturo Espinoza, University of Texas, El Paso; Hugo Gomez, University of Texas, El Paso; Herminia Hemmitt, University of Texas, El Paso; Randy Hazael Anaya, University of Texas, El Paso; Peter Golding, University of Texas, El Paso; Hector Erick Lugo Nevarez, University of Texas, El Paso
Ting-Ting Wu, Graduate School of Technological and Vocational Education, National Yunlin University of Science and Technology; Rustam Shadiev, Department of Engineering Science, National Cheng Kung University; Yueh-Min (Ray) Huang, National Cheng Kung University; Chin-Feng Lai, National Chung Cheng University
Priya Manohar, Robert Morris University; Sushil Acharya, Robert Morris University; Peter Y. Wu, Robert Morris University; Ali A. Ansari, Virginia State University; Walter W. Schilling Jr., Milwaukee School of Engineering
Shuang Wei, Purdue University, West Lafayette; Yingjie Chen, Purdue University, West Lafayette; Tim McGraw, Purdue University; April Ginther, Purdue University
Computer-Based Tests, Problems, and Other Instructional Materials
Collection
2015 ASEE Annual Conference & Exposition
Authors
Craig Zilles, University of Illinois, Urbana-Champaign; Robert Timothy Deloatch, University of Illinois, Urbana Champaign; Jacob Bailey, University of Illinois; Bhuwan B. Khattar; Wade Fagen-Ulmschneider, University of Illinois, Urbana-Champaign; Cinda Heeren, University of Illinois, Urbana-Champaign; David Mussulman, Engineering IT Shared Services, University of Illinois, Urbana-Champaign; Matthew West, University of Illinois, Urbana-Champaign