Seemein Shayesteh P.E., Indiana University Purdue University - Indianapolis; Maher E. Rizkalla, Indiana University Purdue University - Indianapolis; Lauren Christopher, Electrical and Computer Engineering, IUPUI; Zina Ben Miled, ECE Department, Purdue School of Engineering and Technology, Indiana University Purdue University - Indianapolis
Evelyn Sowells-Boone, North Carolina A&T State University; Cameron Seay, North Carolina A&T State University; Dewayne Randolph Brown, North Carolina A&T State University
Kenneth A. Connor, Rensselaer Polytechnic Institute; Yacob Astatke, Morgan State University; Charles J. Kim, Howard University; Mohamed F. Chouikha, Howard University; Dianna Newman, University at Albany - SUNY; Kathy Ann Gullie PhD, Evaluation Consortium: University at Albany - SUNY; Abdelnasser A. Eldek, Jackson State University; Satinderpaul S. Devgan P.E., Tennessee State University; Ali Reza Osareh, NC A&T State University; John Okyere Attia P.E., Prairie View A&M University; Saleh Zein-Sabatto, Tennessee State University; Demetris L. Geddis, Norfolk State University
Kenneth A. Connor, Rensselaer Polytechnic Institute; Dianna Newman, University at Albany - SUNY; Kathy Ann Gullie PhD, Evaluation Consortium University at Albany - SUNY; Yacob Astatke, Morgan State University; Mohamed F. Chouikha, Howard University; Charles J. Kim, Howard University; Otsebele E. Nare, Hampton University; John Okyere Attia P.E., Prairie View A&M University; Petru Andrei, Florida A&M University/Florida State University; Lisa D. Hobson, Prairie View A&M University
Justin L. Hess, Purdue University, West Lafayette; Lorraine G. Kisselburgh, Purdue University; Carla B. Zoltowski, Purdue University, West Lafayette; Andrew O. Brightman, Purdue University, West Lafayette
Computing & Information Technology Division Technical Session
Collection
2016 ASEE Annual Conference & Exposition
Authors
Sanjit K. Mitra, University of California - Santa Barbara; Woon-Seng Gan, Nanyang Technological University; Phyo Ko Ko, Nanyang Technological University; Hai Nguyen Duy, Nanyang Technological University
Tom Chen, Colorado State University; Anthony A. Maciejewski, Colorado State University; Branislav M. Notaros, Colorado State University; Ali Pezeshki, Colorado State University; Melissa D. Reese, Colorado State University