Rob O. Hovsapian, Florida State Univeristy ; Chiang Shih, Florida A&M University/Florida State University; Bruce A. Harvey, Florida A&M University/Florida State University, College of Engineering; Okenwa I. Okoli, Florida A&M University/Florida State University
R. Keith Stanfill, University of Florida; Arif Mohsin, University of Florida; Oscar Crisalle, University of Florida; Suleyman Tufekci, University of Florida; Carl Crane, University of Florida
Peter J. Shull, Pennsylvania State University, Altoona; Carla Firetto, The Pennyslvania State University; L.J. Passmore, Pennsylvania State University, Altoona
Julia Ellen Melkers, Geogia Institute of Technology; Agrita Kiopa, Georgia Institute of Technology; Randal T. Abler, Georgia Institute of Technology; Edward J. Coyle, Georgia Institute of Technology; Joseph M. Ernst, Purdue University; James V. Krogmeier, Purdue University, West Lafayette; Amos Johnson, Morehouse College
Kelly Crittenden, Louisiana Tech University; David Hall, Louisiana Tech University; Mark Barker, Louisiana Tech University; Patricia Brackin, Rose-Hulman Institute of Technology
Kala Meah, York College of Pennsylvania; Timothy Garrison, York College of Pennsylvania; James Kearns, York College of Pennsylvania; Gregory Link, York College of Pennsylvania; Laura Garrison, York College of Pennsylvania; Wayne Blanding, York College of Pennsylvania; Emine Celik, York College of Pennsylvania; Jennifer Dawson, York College of Pennsylvania; Stephen Kuchnicki, York College of Pennsylvania; Barry McFarland, York College of Pennsylvania
Daniel Schrage, Georgia Institute of Technology; Michael Richey, The Boeing Company; Kenneth McPherson, The Boeing Company; Xavier Fouger, Dassault Systemes; Cedric Simard, Dassault Systemes
Xiaobo Peng, Prairie View A&M University; Katie Grantham Lough, Missouri University of Science and Technology; Benjamin Dow, Missouri University of Science and Technology