Jorge Crichigno, Northern New Mexico College; Gregory L. Heileman, University of New Mexico; Ivan Lopez Hurtado, Northern New Mexico College; Alfredo J. Perez, Northern New Mexico College; Ramiro Jordan P.E., University of New Mexico; Timothy L Schroeder; José Marcio Luna, Department of Electrical and Computer Engineering at the University of New Mexico
Margret Hjalmarson, George Mason University; Jill K Nelson, George Mason University; Lisa G. Huettel, Duke University; Wayne T. Padgett, Rose-Hulman Institute of Technology; Kathleen E. Wage, George Mason University; John R. Buck, University of Massachusetts, Dartmouth
Karl L Wang, Department of Engineering Harvey Mudd College 301 Platt Boulevard Clarement, CA 91711 909-607-9136 ; Clint S Cole, Digilent, Inc.; Tinghui Wang, Digilent Inc; Joe Harris, Digilent, Inc.
ABET Accreditation, Assessment, and Program Improvement in ECE
Collection
2012 ASEE Annual Conference & Exposition
Authors
Larry L Wear, University of Washington, Tacoma; Orlando R. Baiocchi, University of Washington, Tacoma; Matthew Alden, University of Washington, Tacoma; Robert Gutmann, University of Washington, Tacoma; Jie Sheng, University of Washington, Tacoma
Mircea Alexandru Dabacan, Technical University of Cluj-Napoca; Clint S. Cole, Digilent, Inc.; Mihaela Radu, Rose-Hulman Institute of Technology; Joe Harris, Digilent, Inc.; Alex DUPE Wong; Monica Bot
Aharon Gero, Technion - Israel Institute of Technology; Wishah Zoabi, Technion – Israel Institute of Technology; Nissim Sabag, Ort Braude College of Engineering
Seyed Hossein Mousavinezhad, Idaho State University; Paul J. Benkeser, Georgia Institute of Technology; Pamela Bhatti, Georgia Institute of Technology; Burton Dicht, IEEE; Douglas Gorham, IEEE; Chris Macnab, University of Calgary; Sadiq Mitchell, IEEE; Cherrice Traver, Union College; Stephen M. Williams P.E., Milwaukee School of Engineering; Loren Wyard-Scott, University of Alberta