Ruben Otero, Student at University of Puerto Rico - Mayaguez; Apurva Somani, University of Minnesota; Krushna Mohapatra, University of Minnesota; Ned Mohan, University of Minnesota
Yacob Astatke, Morgan State University; Kenneth A Connor, Rensselaer Polytechnic Institute; Dianna Newman, University at Albany-SUNY; John Okyere Attia P.E., Prairie View A&M University; Otsebele E Nare, Hampton University
Dorin Patru, Rochester Institute of Technology; Daniel Phillips, Rochester Institute of Technology; Eric Peskin, Rochester Institute of Technology (COE)
Zekeriya Aliyazicioglu, California State Polytechnic University-Pomona; Saeed Monemi, California State Polytechnic University-Pomona; Tim Lin, California State Polytechnic University-Pomona
James Harris, California Polytechnic State University; Dominic Dalbello, Allan Hancock College; Jianbiao Pan, California Polytechnic State University; Albert Liddicoat, California Polytechnic State University
Ronald F. DeMara, University of Central Florida; Navid Khoshavi, University of Central Florida; Steven D. Pyle, University of Central Florida; John Edison, University of Central Florida; Richard Hartshorne, University of Central Florida; Baiyun Chen, University of Central Florida; Michael Georgiopoulos, University of Central Florida; Ronald F. DeMara, University of Central Florida
Jenny E.G. Porch; Ryan Michael Coyne, University of Maryland, Eastern Shore; Lei Zhang, University of Maryland, Eastern Shore; Ibibia K. Dabipi, University of Maryland, Eastern Shore
Jorge Crichigno, Northern New Mexico College; Gregory L. Heileman, University of New Mexico; Ivan Lopez Hurtado, Northern New Mexico College; Alfredo J. Perez, Northern New Mexico College; Ramiro Jordan P.E., University of New Mexico; Timothy L Schroeder; José Marcio Luna, Department of Electrical and Computer Engineering at the University of New Mexico
Margret Hjalmarson, George Mason University; Jill K Nelson, George Mason University; Lisa G. Huettel, Duke University; Wayne T. Padgett, Rose-Hulman Institute of Technology; Kathleen E. Wage, George Mason University; John R. Buck, University of Massachusetts, Dartmouth
Seyed Hossein Mousavinezhad, Idaho State University; Paul J. Benkeser, Georgia Institute of Technology; Pamela Bhatti, Georgia Institute of Technology; Burton Dicht, IEEE; Douglas Gorham, IEEE; Chris Macnab, University of Calgary; Sadiq Mitchell, IEEE; Cherrice Traver, Union College; Stephen M. Williams P.E., Milwaukee School of Engineering; Loren Wyard-Scott, University of Alberta
Gerard Rowe, University of Auckland; Chris Smaill, University of Auckland; Lawrence Carter, University of Auckland; Elizabeth Godfrey, University of Technology Sydney; Bernard Guillemin, The University of Auckland; Mark Andrews, University of Auckland; Waleed Abdulla, University of Auckland
Christopher Van Arsdale, Michigan Technological University; Anna Pereira, Michigan Technological University; Leonard Bohmann, Michigan Technological University; Michele Miller, Michigan Technological University; William Helton, Michigan Technological University