Jahangir Ansari, Virginia State University; Amir Javaheri, Virginia State University; Stephen S. Tompkins, Virgina State University; Keith Williamson, Virginia State University
Ann Goebel, Minnesota State University, Mankato; Harry Petersen, Minnesota State University, Mankato; William Peterson, Minnesota State University, Mankato
Hung-da Wan, University of Texas, San Antonio; Venkata Tarun Cherukuri, University of Texas, San Antonio; Saumya Tamma, University of Texas, San Antonio; Kranthi Kumar Tiyyagura, University of Texas, San Antonio
Michael G. Mauk, Drexel University; Richard Chiou, Drexel University (Eng. & Eng. Tech.); Shraman Kadapa, Drexel University (Eng. & Eng. Tech.); Tzu-Liang Bill Tseng, University of Texas, El Paso
Michael G. Mauk, Drexel University; Richard Chiou, Drexel University (Eng. & Eng. Tech.); Irina Nicoleta Ciobanescu Husanu, Drexel University (Tech.); David English; Michael Naceri Hazm
Roby Lynn; Kathryn W. Jablokow, Pennsylvania State University, Great Valley; Christopher Saldana; Thomas Marshall Tucker, Tucker Innovations; Thomas Kurfess, Georgia Institute of Technology
Eric Holloway, Purdue University, West Lafayette (College of Engineering); William C. Oakes, Purdue University, West Lafayette (College of Engineering)
Richard Chiou, Drexel University (Eng. & Eng. Tech.); Michael G Mauk P.E., Drexel University; Carlos Michael Ruiz, Drexel University (Eng. & Eng. Tech.)
Experiences in Manufacturing Engineering Education
Collection
2018 ASEE Annual Conference & Exposition
Authors
Hossein Rahemi, Vaughn College of Aeronautics & Technology; Amir Elzawawy, Vaughn College of Aeronautics & Technology; Yougashwar Budhoo, Vaughn College of Aeronautics and Technology
Richard Chiou, Drexel University (Eng. & Eng. Tech.); Michael G Mauk P.E., Drexel University; Tzu-Liang Bill Tseng, University of Texas, El Paso; Carlos Michael Ruiz, Drexel University (Eng. & Eng. Tech.); Jean Carlo Espaillat; Senyu Wang
Daniel R Khodos; David I Adegbesan, Vaughn College of Aeronautics and Technology; Oliver Khairallah; Shouling He, Vaughn College of Aeronautics & Technology
Samuel H. Huang, University of Cincinnati; Sam Anand, University of Cincinnati; Manish Kumar, University of Toledo; Imelda Castañeda-Emenaker, University of Cincinnati