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The Assessment Cookbook: Recipes For Successfully Meeting Tc2 K Criteria

Conference Session: Program Assessment in ET
Collection: 2002 Annual Conference
Authors: Gregory Neff; Susan Scachitti

Relevance Score: 4.7613387

Continuous Improvement In Engineering Technology Programs

Conference Session: Program Assessment in ET
Collection: 2002 Annual Conference
Authors: Raymond Kliewer

Relevance Score: 4.7613387

Outcomes Assessment In An Met Program

Conference Session: Program Assessment in ET
Collection: 2002 Annual Conference
Authors: Kenneth Rennels

Relevance Score: 4.7613387

Assessment: How Much Is Too Much Or How Much Is Enough?

Conference Session: Program Assessment in ET
Collection: 2002 Annual Conference
Authors: Erdogan Sener

Relevance Score: 4.7613387

Abet's Technological Education Initiative: Focus On Faculty

Conference Session: Program Assessment in ET
Collection: 2002 Annual Conference
Authors: Maryanne Weiss; Mark Pagano; Margaret Weeks

Relevance Score: 4.7613387

An Effective Approach To Assess Teaching Industrial Electronics

Conference Session: Assessment and Continuous Improvement in Electronics and Electrical ET Programs
Collection: 2009 Annual Conference & Exposition
Authors: Youakim Al Kalaani, Georgia Southern University
Tagged Divisions: Engineering Technology

Relevance Score: 3.571004

The Electrical Engineering Technology Program Educational Objectives (Peos): Are They Measurable, And How?

Conference Session: Assessment and Continuous Improvement in Electronics and Electrical ET Programs
Collection: 2009 Annual Conference & Exposition
Authors: Nasser Alaraje, Michigan Technological University
Tagged Divisions: Engineering Technology

Relevance Score: 3.571004

The Electrical Engineering Technology Program Outcomes Assessment Process: Closing The Loop

Conference Session: Assessment and Continuous Improvement in Electronics and Electrical ET Programs
Collection: 2009 Annual Conference & Exposition
Authors: Nasser Alaraje, Michigan Technological University; John Irwin, Michigan Technological University
Tagged Divisions: Engineering Technology

Relevance Score: 3.571004

Development Of Course Assessment Metrics To Measure Program Outcomes Against Abet Criteria In A Digital Circuits Class

Conference Session: Assessment and Continuous Improvement in Electronics and Electrical ET Programs
Collection: 2009 Annual Conference & Exposition
Authors: Min-Sung Koh, Eastern Washington University; Esteban Rodriguez-Marek, Eastern Washington University; Claudio Talarico, Eastern Washington University
Tagged Divisions: Engineering Technology

Relevance Score: 3.571004