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Peter Bermel

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Validity Evidence for Exposure and Motivation Scales in a Microelectronics Workforce Development Program

Conference Session
College Industry Partnerships Division Technical Session 2
Collection
2022 ASEE Annual Conference & Exposition
Authors
Adrian Gentry; Peter Bermel, Purdue University at West Lafayette (COE); Eric Holloway, Purdue University at West Lafayette (COE); Kerrie Douglas, Purdue University at West Lafayette (COE)