Lai, G. (2001, June), Integration Of Enhanced Coordinate Measuring Machine Systems With Manufacturing Engineering Laboratories And Curriculum At Kettering University  Paper presented at 2001 Annual Conference, Albuquerque, New Mexico. 10.18260/1-2--9428

\bibitem{asee_peer_9428}
  Lai, G. (2001, June), \emph{Integration Of Enhanced Coordinate Measuring Machine Systems With Manufacturing Engineering Laboratories And Curriculum At Kettering University}
  Paper presented at 2001 Annual Conference, Albuquerque, New Mexico.
  10.18260/1-2--9428

Gwan-Ywan Lai.  "Integration Of Enhanced Coordinate Measuring Machine Systems With Manufacturing Engineering Laboratories And Curriculum At Kettering University".  2001 Annual Conference, Albuquerque, New Mexico, 2001, June.  ASEE Conferences, 2001.  https://strategy.asee.org/9428 Internet.  03 Jul, 2024

\bibitem{asee_peer_9428}
  Gwan-Ywan Lai.
  "Integration Of Enhanced Coordinate Measuring Machine Systems With Manufacturing Engineering Laboratories And Curriculum At Kettering University".
  \emph{2001 Annual Conference, Albuquerque, New Mexico, 2001, June}.
  ASEE Conferences, 2001.
  https://strategy.asee.org/9428 Internet.  03 Jul, 2024

@INPROCEEDINGS{asee_peer_9428
author = "Gwan-Ywan Lai"
title = "Integration Of Enhanced Coordinate Measuring Machine Systems With Manufacturing Engineering Laboratories And Curriculum At Kettering University"
booktitle = "2001 Annual Conference"
year = "2001"
month = "June"
address = "Albuquerque, New Mexico"
publisher = "ASEE Conferences"
note = {https://strategy.asee.org/9428}
number = {10.18260/1-2--9428}
}

TY  - CPAPER
AB  - Coordinate Measuring Machines (CMMs) are one of the most powerful and widely used metrological instruments in the manufacturing industry. There is virtually no workpiece whose dimensions cannot be measured with a properly equipped CMM system [1-6]. This National Science Foundation funded project (NSF-ILI: DUE-9851082) is to enhance two existing CMMs in the Metrology laboratory at Kettering University by acquiring two motorized probe heads, an automatic probe exchange system, a stylus changing probe and rack system, a laser digitizing system, and PC-DMIS CMM inspection software. The enhanced CMM systems allow for integration of modern, automated, and CAD-directed coordinate metrology as well as state-of- the-art laser digitizing technology into Manufacturing Engineering laboratories and curriculum at Kettering University. The project impacts students enrolled in the freshman course, MFGE-101 Manufacturing Processes and upper level courses such as Numerically Controlled (NC) Systems, Polymer Processing, and Computer Integrated Manufacturing (CIM) Systems.
AU  - Gwan-Ywan Lai
CY  - Albuquerque, New Mexico
DA  - 2001/06/24
PB  - ASEE Conferences
TI  - Integration Of Enhanced Coordinate Measuring Machine Systems With Manufacturing Engineering Laboratories And Curriculum At Kettering University
UR  - https://strategy.asee.org/9428
DO  - 10.18260/1-2--9428
ER  -