Arnold Lumsdaine, University of Tennessee; Frank Speckhart, University of Tennessee-Knoxville; Geoff Robson, Technology 2020; Kenneth Kahn, University of Tennessee-Knoxville; Majid Keyhani, University of Tennessee-Knoxville; Dan Fant, University of Tennessee-Knoxville; Rapinder Sawhney, University of Tennessee-Knoxville
Youssef Allam, Ohio State University; David Tomasko, Ohio State University; John Merrill, Ohio State University; Bruce Trott, Ohio State University; Phil Schlosser, Ohio State University; Paul Clingan, Ohio State University
International Exchange/Joint Programs in Engineering
Collection
2006 Annual Conference & Exposition
Authors
Masakatsu Matsuishi, Kanazawa Institute of Technology; Wayne Sanders, Rose Hulman Institute Of Technology; Kazuya Takamata, Kanazawa Institute of Technology; Tetsuro Furukawa, Kanazawa Institute of Technology; Loo Ching Nong, Singapore Polytechnic
Engineering Without Borders Programs Involving Students
Collection
2006 Annual Conference & Exposition
Authors
Bernard Amadei, University of Colorado-Boulder; Robyn Sandekian, University of Colorado-Boulder; R. Scott Summers, University of Colorado-Boulder; Angela Bielefeldt, University of Colorado-Boulder
Gordon Kingsley, Georgia Institute of Technology; Monica Gaughan, Georgia Institute of Technology; Donna Llewellyn, Georgia Institute of Technology; Marion Usselman, Georgia Institute of Technology
International Exchange/Joint Programs in Engineering
Collection
2006 Annual Conference & Exposition
Authors
John Rowe, Sheffield Hallam University; Tim Mulroy, Sheffield Hallam University; Ian Robinson, Sheffield Hallam University; Boon Han Lye, Kolej Bandar Utama International College
Pat Pyke, Boise State University; Leandra Aburusa-Lete, Boise State University; Christa Budinoff, Visioneering LLC; Janet Callahan; Michael Luque, Boise School District; Cheryl Schrader, Boise State University; Michelle Taylor, Micron Technology, Inc.
Raghvinder Sangwan, Pennsylvania State University; Kathryn Jablokow, Pennsylvania State University-Great Valley; Matt Bass, Siemens Corporate Research; Dan Paulish, Siemens Corporate Research