Francisco Gamboa Valderrama, Universidad Nacional Experimental del Tachira; Bianey Ruiz, University of Tachira; Dilia Alcalde, Universidad Nacional Experimental del Tachira
Ertunga Ozelkan, University of North Carolina-Charlotte; S. Gary Teng, University of North Carolina-Charlotte; Thomas Johnson, Besam Entrance Solutions; Tom Benson, Pass and Seymour-Legrand; Dean Nestvogel, Pass and Seymour-Legrand
Yesim Sireli, University of North Carolina-Charlotte; James Conrad, University of North Carolina-Charlotte; Martin Kane, University of North Carolina-Charlotte; Frank Skinner, University of North Carolina-Charlotte
David Elizandro, Tennessee Technological University; Angelo A. Volpe, Tennessee Technological University; David H. Huddleston, Tennessee Technological University
S. Gary Teng, University of North Carolina-Charlotte; Ertunga Ozelkan, University of North Carolina-Charlotte; Yesim Sireli, University of North Carolina-Charlotte; Karen Elmore, University of North Carolina-Charlotte
Bianey Ruiz Ulloa, Universidad Nacional Experimental del Tachira; Sheila Lizcano, Universidad Nacional Experimental del Tachira; Francisco Gamboa, University of Tachira; Dilia Alcalde, Universidad Nacional Experimental del Tachira; Stephanie Adams, University of Nebraska-Lincoln
Stephen Raper, Missouri University of Science and Technology; Susan Murray, Missouri University of Science and Technology; Christa Weisbrook, Missouri University of Science and Technology; William Daughton, University of Missouri