Simin Nasseri, Society of Manufacturing Engineers; Mohammad Jonaidi, Kennesaw State University; Navid Nasajpour Esfahani, Georgia Institute of Technology; Ralph Schultz, Kennesaw State University
Saúl Enrique Crespo Sánchez, Tecnologico de Monterrey (ITESM); Miguel X. Rodriguez-Paz, Tecnologico de Monterrey (ITESM); Luis Hernandez Carrasco, Tecnologico de Monterrey (ITESM)
Adam Wickenheiser, University of Delaware; Jenni Buckley, University of Delaware; Amy Trauth, University of Delaware; Marcia Gail Headley, University of Delaware
Michele Grimm, Michigan State University; Ron Averill, Michigan State University; Sara Roccabianca, Michigan State University; Geoffrey Recktenwald, Michigan State University
Annie Wang, University of Michigan; Cassandra Jamison, University of Michigan; Jan Stegemann, University of Michigan; Aileen Huang-Saad, Northeastern University
John Liu, Massachusetts Institute of Technology; Nisal Ovitigala; Benita Comeau, Massachusetts Institute of Technology; Emily Welsh, Massachusetts Institute of Technology; Nicholas Fang, Massachusetts Institute of Technology
Megan Ngo, Massachusetts Institute of Technology; Emily Welsh, Massachusetts Institute of Technology; Benita Comeau, Massachusetts Institute of Technology; Nicholas Fang, Massachusetts Institute of Technology; John Liu, Massachusetts Institute of Technology; Kachina Studer