Jacob Dunn, University of Idaho Integrated Design Lab, Boise; Gunnar Ryan Gladics, University of Idaho, Integrated Design Lab; Kevin Van Den Wymelenberg, University of Idaho Integrated Design Lab, Boise; Ery Djunaedy, University of Idaho Integrated Design Lab, Boise; Sherry McKibben, University of Idaho IURDC, McKibben + Cooper Architects
Yakov Cherner, ATEL, LLC; Sonia Sparks Wallman; Margaret Bryans, Montgomery County Community College; Marina Taranova, Southern Federal University, Russia
JUDITH VIRGINIA GUTIERREZ, Universidad de las Americas, Puebla; Aurelio Lopez-Malo, Universidad de las Americas, Puebla; Enrique Palou, Universidad de las Americas, Puebla
Paul G. Flikkema, Northern Arizona University; Kenji Ryan Yamamoto, Northern Arizona University; Carol Haden, Magnolia Consulting, LLC; Jeff Frolik, University of Vermont; Tom Weller, University of South Florida
Mihaela Radu, Rose-Hulman Institute of Technology; Clint S. Cole, Digilent, Inc.; Joe Harris, Digilent, Inc.; Mircea Dabacan, Technical University of Cluj-Napoca
Dale S.L. Dolan, California Polytechnic State University; Vladimir I. Prodanov, California Polytechnic State University, San Luis Obispo; Taufik Taufik, California Polytechnic State University
David Jakob Fritz, Oklahoma State University; Wira Mulia, Oklahoma State University; Sohum Sohoni, Oklahoma State University; Kerri S. Kearney, Oklahoma State University; Mwarumba Mwavita, Oklahoma State University
Kenneth A. Connor, Rensselaer Polytechnic Institute; Frederick C Berry, Milwaukee School of Engineering; Mohamed F. Chouikha, Howard University; Dianna Newman, University at Albany/SUNY; Meghan Morris Deyoe, The Evaluation Consortium; Gavin Anaya; William Brubaker, Rensselaer Polytechnic Institute
Patrick Kane, Cypress Semiconductor Corp.; Alexander Ganago, University of Michigan; Robert F. Giles, University of Michigan; Hongwei Liao, University of Michigan, Ann Arbor
David A. Koonce, Ohio University; Jie Zhou, Ohio University; Cynthia D. Anderson, Ohio University; Dyah A. Hening; Valerie Martin Conley, Ohio University
Theodore J. Branoff, North Carolina State University; Eric N. Wiebe, North Carolina State University; Mark Anthony Shreve, North Carolina State University