JUDITH VIRGINIA GUTIERREZ, Universidad de las Americas, Puebla; Aurelio Lopez-Malo, Universidad de las Americas, Puebla; Enrique Palou, Universidad de las Americas, Puebla
Oscar Antonio Perez, University of Texas, El Paso; Virgilio Gonzalez, University of Texas, El Paso; Michael Thomas Pitcher, University of Texas, El Paso; Peter Golding, University of Texas, El Paso
Norman Moses Joseph, Purdue University; David M. Whittinghill, Purdue University, West Lafayette; Kathleen C. Howell, Purdue University, West Lafayette; David William Braun, Purdue University
Paul G. Flikkema, Northern Arizona University; Kenji Ryan Yamamoto, Northern Arizona University; Carol Haden, Magnolia Consulting, LLC; Jeff Frolik, University of Vermont; Tom Weller, University of South Florida
Mihaela Radu, Rose-Hulman Institute of Technology; Clint S. Cole, Digilent, Inc.; Joe Harris, Digilent, Inc.; Mircea Dabacan, Technical University of Cluj-Napoca
Dale S.L. Dolan, California Polytechnic State University; Vladimir I. Prodanov, California Polytechnic State University, San Luis Obispo; Taufik Taufik, California Polytechnic State University
David Jakob Fritz, Oklahoma State University; Wira Mulia, Oklahoma State University; Sohum Sohoni, Oklahoma State University; Kerri S. Kearney, Oklahoma State University; Mwarumba Mwavita, Oklahoma State University
Kenneth A. Connor, Rensselaer Polytechnic Institute; Frederick C Berry, Milwaukee School of Engineering; Mohamed F. Chouikha, Howard University; Dianna Newman, University at Albany/SUNY; Meghan Morris Deyoe, The Evaluation Consortium; Gavin Anaya; William Brubaker, Rensselaer Polytechnic Institute
Patrick Kane, Cypress Semiconductor Corp.; Alexander Ganago, University of Michigan; Robert F. Giles, University of Michigan; Hongwei Liao, University of Michigan, Ann Arbor
Anurag K. Srivastava, Washington State University; Soumya K. Srivastava, Washington State University; Adrienne R. Minerick, Michigan Technological University; Noel N. Schulz, Kansas State University