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Michael Alexander Liu

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Board 78: Interdisciplinary Research Experiences for Undergraduates in Metrology and Non-Destructive Inspection

Conference Session
NSF Grantees Poster Session
Collection
2018 ASEE Annual Conference & Exposition
Authors
Mathew Kuttolamadom, Texas A&M University; Michael Alexander Liu, Texas A&M University; Jyhwen Wang, Texas A&M University; Bruce L. Tai, Texas A&M University; Samuel F. Noynaert, Texas A&M University; Dinakar Sagapuram, Texas A & M University; Marian S. Kennedy, Clemson University